• DocumentCode
    867054
  • Title

    Production of p¿n junctions with bulk controlled characteristics

  • Author

    Maddex, K.A. ; Young, M.R.P.

  • Author_Institution
    Texas Instruments Ltd., Bedford, UK
  • Volume
    1
  • Issue
    7
  • fYear
    1965
  • fDate
    9/1/1965 12:00:00 AM
  • Firstpage
    191
  • Lastpage
    192
  • Abstract
    Two methods of eliminating surface effects so that microplasma breakdown of p¿n junctions can be observed are described, and their limitations are discussed. The first, applicable to diffused junctions, increases the space-charge-layer width, while the second reduces the applied voltage at the periphery of alloyed structures.
  • Keywords
    electric breakdown; plasma; semiconductor junctions;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19650176
  • Filename
    4205718
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=867054