Noise and sensitivity analysis for miniature E-field probes

Author

Ng, K.T. ; Batchman, T.E. ; Pavlica, Steve ; Veasey, D.L.

Author_Institution

Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA

Volume

38

Issue

1

fYear

1989

fDate

2/1/1989 12:00:00 AM

Firstpage

27

Lastpage

31

Abstract

A complete noise analysis of a miniature field probe connected to an amplification system is presented. The analysis predicts a theoretical minimum detectable E-field of 2.8 V/m for the field probe. Frequency-domain noise measurements using a spectrum analyzer, on the other hand, give a minimum detectable E-field of 16.2 V/m. In addition, time-domain noise measurements, using a slotted line and a microwave, give a minimum detectable E-field of about 13 V/m. Considering the number of approximations made in the treatment and the amount of external noise present in the laboratory, the correlation of the theory to the measurement is considered adequate. The sensitivity of the probe output voltage with respect to the various parameters is analyzed

Keywords

electric field measurement; electric noise measurement; electric sensing devices; probes; correlation; frequency domain noise measurement; miniature E-field probes; noise analysis; sensitivity analysis; slotted line; spectrum analyzer; time-domain noise measurements; Dipole antennas; Electromagnetic measurements; Fabrication; Microwave devices; Microwave measurements; Noise measurement; Probes; Receiving antennas; Sensitivity analysis; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.19993

Filename

19993