DocumentCode

867393

Title

Shelf and operating life studies on SiO protected CdSe thin-film triodes

Author

Gutierrez, W.A.

Volume

53

Issue

1

fYear

1965

Firstpage

92

Lastpage

93

Keywords

Aging; Circuit testing; Degradation; Electrodes; Fabrication; Life testing; Performance evaluation; Protection; Stability; Thin film transistors;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1965.3542

Filename

1445472