Magnetic and structural studies in sputtered Co/C multilayers

Author

Krishnan, R. ; Gupta, H.O. ; Sella, C. ; Kaabouchi, M.

Author_Institution

Lab. de Magnetisme, CNRS, Meudon, France

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

2756

Lastpage

2758

Abstract

Co/C multilayers have been prepared by triode sputtering under controlled conditions. Their structural, magnetic, and FMR (ferromagnetic resonance) properties have been investigated. For t (Co)<4 nm, an amorphous-like structure which upon annealing goes to the hexagonal Co₂C phase is formed. Hexagonal structure is obtained for t(Co)>6 nm. The magnetization decreases steeply for t(Co)<6 nm. In-plane uniaxial anisotropy is induced in the multilayers and depends on t(C). H_c decreases with t(Co). In-plane uniaxial anisotropy is induced by layering. FMR studies show that perpendicular anisotropy is present for t(Co)>8 nm, and an easy plane is present for t(Co)<8 nm

Keywords

X-ray diffraction examination of materials; annealing; carbon; cobalt; electron diffraction examination of materials; ferromagnetic resonance; induced anisotropy (magnetic); magnetic thin films; magnetisation; sputtered coatings; Co-C sputtered multilayers; FMR; X-ray diffraction; annealing; electron diffraction; ferromagnetic resonance; hexagonal structure; in-plane uniaxial anisotropy; magnetization; perpendicular anisotropy; structural properties; triode sputtering; Amorphous magnetic materials; Anisotropic magnetoresistance; Annealing; Magnetic multilayers; Magnetic resonance; Magnetization; Mirrors; Optical films; Sputtering; X-ray diffraction;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104862

Filename

104862