• DocumentCode
    868798
  • Title

    Selection of the Optimal Memory Configuration in a System Affected by Soft Errors

  • Author

    Maestro, Juan Antonio ; Reviriego, Pedro

  • Author_Institution
    Univ. Antonio de Nebrija, Madrid, Spain
  • Volume
    9
  • Issue
    3
  • fYear
    2009
  • Firstpage
    403
  • Lastpage
    411
  • Abstract
    The selection of the best memory configuration is a challenge for designers when systems are affected by soft errors. When memory reliability is an issue and scrubbing is not recommendable, multibit protection codes are one of the available options. In this paper, the reliability of memories protected with those codes is studied. First, a method to analytically approximate the mean number of events to failure of memories protected with error correction codes capable of handling multiple bit errors is presented and validated through simulation experiments. Then, the selection of the optimal protection code for a given memory configuration in terms of memory size, word length, and target reliability level is analyzed. This selection process is illustrated using a practical case study. The study is then extended to determine, for a given error correcting code, the maximum memory size that would meet a target reliability level. Finally, the effect of the memory word size on the system reliability is considered by comparing different options. In summary, the proposed methods can be useful for designers when choosing the memory configuration at the system level for critical applications in which reliability is a major concern.
  • Keywords
    DRAM chips; circuit reliability; error correction codes; DRAM; error correction codes; memory reliability; memory size; multibit protection codes; multiple bit errors; optimal memory configuration; single-event upsets; soft errors; target reliability level; word length; Memory; multibit error correction codes; reliability; single-event upsets (SEUs); soft errors;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2009.2023081
  • Filename
    4926232