• DocumentCode
    870414
  • Title

    Transit-time model for short-channel MOSFET´s

  • Author

    Andersson, Mats ; Kuivalainen, P.

  • Author_Institution
    Semicond. Lab., Tech. Res. Centre of Finland, Espoo
  • Volume
    40
  • Issue
    4
  • fYear
    1993
  • fDate
    4/1/1993 12:00:00 AM
  • Firstpage
    830
  • Lastpage
    832
  • Abstract
    A new analytical transit-time model for submicrometer MOS devices has been developed. The model is based on a modified SPICE level-three MOSFET DC model, and it allows the use of a physical value for the charge carrier saturation velocity. This is essential for accurate transit-time modeling. Both DC and transit-time models show good agreement with the results obtained from more complicated two-dimensional numerical simulations
  • Keywords
    SPICE; insulated gate field effect transistors; semiconductor device models; MOS3; MOSFET DC model; SPICE level three model; analytical model; charge carrier saturation velocity; short channel MOSFETs; submicrometer MOS devices; transit-time model; Analytical models; Charge carriers; Electron devices; Electron emission; Equations; Integrated circuit modeling; MOS devices; MOSFET circuits; SPICE; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.202799
  • Filename
    202799