• DocumentCode
    870750
  • Title

    Elastic and piezoelectric properties of La/sub 3/Ga/sub 5/SiO/sub 14/ and La/sub 3/Ga/sub 5.5/Ta/sub 0.5/O/sub 14/: an application of resonant ultrasound spectroscopy

  • Author

    Schreuer, Jürgen

  • Author_Institution
    Lab. of Crystallogr., Swiss Fed. Inst. of Technol., Zurich, Switzerland
  • Volume
    49
  • Issue
    11
  • fYear
    2002
  • Firstpage
    1474
  • Lastpage
    1479
  • Abstract
    The electromechanical properties of La/sub 3/Ga/sub 5/SiO/sub 14/ (LGS) and La/sub 3/Ga/sub 5.5/Ta/sub 0.5/O/sub 14/ (LGT) have been studied at room temperature on 25 samples using resonant ultrasound spectroscopy (RUS). The RUS method facilitates simultaneous determination of all independent elastic and piezoelectric constants of a sample within the same frequency range and yields sample parameters with high internal consistency. Consequently, the spread of the experimental results presented here is significantly lower than the scatter of literature data obtained by different experimental techniques.
  • Keywords
    acoustic resonance; elastic constants; gallium compounds; lanthanum compounds; piezoelectric materials; ultrasonic measurement; La/sub 3/Ga/sub 5.5/Ta/sub 0.5/O/sub 14/; La/sub 3/Ga/sub 5/SiO/sub 14/; elastic compliances; elastic constants; electromechanical properties; high internal consistency; inverse problem; least squares refinements; piezoelectric constants; piezoelectric stress tensor; resonant ultrasound spectroscopy; room temperature; simultaneous determination; Acoustic scattering; Crystallization; Crystallography; Dielectric constant; Dielectric measurements; Frequency; Resonance; Shape measurement; Spectroscopy; Ultrasonic imaging; Crystallography; Elasticity; Electrochemistry; Magnetic Resonance Spectroscopy; Models, Chemical; Oxides; Sensitivity and Specificity; Silicates; Stress, Mechanical; Transducers; Ultrasonography; Vibration;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2002.1049728
  • Filename
    1049728