• DocumentCode
    872509
  • Title

    Characterization of ion-implanted IMPATT oscillators

  • Author

    Ying, Robert S. ; Mankarious, Ramzy G. ; English, David L. ; Bower, Robert W. ; Coerver, Leo E.

  • Volume
    3
  • Issue
    3
  • fYear
    1968
  • Firstpage
    225
  • Lastpage
    231
  • Abstract
    Recent experimental results on impact avalanche transit-time diode oscillators fabricated by ion implantation are presented. The technique and problems involved are given. The diodes gave CW X-band power output up to 1.4 watts with efficiencies up to 8 percent. AM sideband noise measurements indicate that the load admittance for minimum noise is not coincidental with that load for maximum power output, and that a reduction of 20 dB in noise may be achieved with a reduction of only 0.5 to 3.0 dB in power output from the maximum power point by the proper choice of the load. AM sideband noise as low as 130 dB below the carrier in a 1-kHz bandwidth and at a sideband of 50 kHz from the carrier has been measured utilizing this technique.
  • Keywords
    Avalanche diodes; avalanche diodes; Diodes; Electron devices; Frequency; Ion implantation; Microwave devices; Microwave oscillators; Noise measurement; Noise reduction; Silicon; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1968.1049888
  • Filename
    1049888