DocumentCode
872975
Title
Effect of fixed emission wavelength on threshold current of InGaAsP semiconductor laser diodes
Author
O´Gorman, J. ; Levi, A.F.J.
Author_Institution
AT&T Bell Labs., Murray Hill, NJ, USA
Volume
28
Issue
22
fYear
1992
Firstpage
2091
Lastpage
2093
Abstract
The authors demonstrate and quantify the extent to which a reduced variation of laser diode threshold current with temperature can be achieved by fixing lasing wavelength on the long wavelength side of the room temperature gain peak. This enhancement (T0=92 K) occurs at the expense of increased threshold current at low temperatures. Fixing the lasing wavelength on the short wavelength side of the room temperature gain peak to reduce dynamic spectral broadening occurring at high modulation rates leads to reduced T0 (=30 K) in comparison to Fabry-Perot laser diodes T0 (=42 K) made from the same material.
Keywords
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; semiconductor lasers; InGaAsP; dynamic spectral broadening; fixed emission wavelength; high modulation rates; semiconductor laser diodes; threshold current;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19921341
Filename
204601
Link To Document