• DocumentCode
    872975
  • Title

    Effect of fixed emission wavelength on threshold current of InGaAsP semiconductor laser diodes

  • Author

    O´Gorman, J. ; Levi, A.F.J.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • Volume
    28
  • Issue
    22
  • fYear
    1992
  • Firstpage
    2091
  • Lastpage
    2093
  • Abstract
    The authors demonstrate and quantify the extent to which a reduced variation of laser diode threshold current with temperature can be achieved by fixing lasing wavelength on the long wavelength side of the room temperature gain peak. This enhancement (T0=92 K) occurs at the expense of increased threshold current at low temperatures. Fixing the lasing wavelength on the short wavelength side of the room temperature gain peak to reduce dynamic spectral broadening occurring at high modulation rates leads to reduced T0 (=30 K) in comparison to Fabry-Perot laser diodes T0 (=42 K) made from the same material.
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; semiconductor lasers; InGaAsP; dynamic spectral broadening; fixed emission wavelength; high modulation rates; semiconductor laser diodes; threshold current;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19921341
  • Filename
    204601