DocumentCode
873284
Title
Scintillation Detection with Large-Area Reach-Through Avalanche Photodiodes
Author
Petrillo, G.A. ; McIntyre, R.J. ; Lecomte, R. ; Lamoureux, G. ; Schmitt, D.
Author_Institution
RCA Inc., Electro-Optics, Ste-Anne-de-Bellevue, Québec, Canada H9X 3L3
Volume
31
Issue
1
fYear
1984
Firstpage
417
Lastpage
423
Abstract
Silicon avalanche photodiodes of the "reach-through" type have been used as scintillation detectors with device performance closely approaching that of PMT\´s. The device consists of a 6 à 6mm diode with a 5 à 5mm photosensitive area in a 6.7 à 6.7 à 2.0mm package which is suitable for mounting in an array. Typical characteristics at room temperature are: quantum efficiency ¿50% at ¿=415nm; surface dark current <200nA; bulk dark-current (before gain) <1nA; noise current (at optimum gain of 20 to 50) <1pA/Hz¿; response time <5ns; capacitance ¿21pF; biasing voltage ¿200-400 Volts. When coupled to a NaI(Tl) scintillator (9 à 9 à 38mm) photo-peak resolutions (FWHM) for 662keV radiation of 10.4% at 21°C and 9.8% at 0°C were measured. The measured noise equivalent primary charge of one detector at a gain of 50 was 121 electrons (51 electrons rms) at room temperature. The significance of this new detector to high resolution imaging systems and detector arrays is discussed.
Keywords
Avalanche photodiodes; Dark current; Delay; Diodes; Electrons; Packaging; Scintillation counters; Silicon; Solid scintillation detectors; Temperature;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1984.4333290
Filename
4333290
Link To Document