• DocumentCode
    873298
  • Title

    Limitations in determining absorbing-material parameters

  • Author

    Falkenbach, George J.

  • Author_Institution
    Battelle Memorial Institute, Columbus, Ohio
  • Volume
    53
  • Issue
    8
  • fYear
    1965
  • Firstpage
    1097
  • Lastpage
    1098
  • Abstract
    Different techniques can be used to evaluate the potential performance of radar-absorbing material (RAM). Transmission-line methods, which are based on distributed parameter measurements, are frequently used to determine its constitutive electromagnetic parameters--ε, µ and η, χ. The thin-sample and short-circuit-open-circuit (SCOC) techniques are most common in the UHF-SHF range. Although simple, the thin-sample method cannot always be used because of thickness limitations. The SCOC method, while relieving that limitation, suffers from others less understood. This paper discusses the considerations necessary in determining the parameters of RAM, and points out some limitations which must be recognized.
  • Keywords
    Coaxial components; Conductivity; Dielectric loss measurement; Dielectric materials; Electromagnetic measurements; Electromagnetic waveguides; Loss measurement; Magnetic materials; Plasma measurements; Shape measurement;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1965.4103
  • Filename
    1446033