DocumentCode
873298
Title
Limitations in determining absorbing-material parameters
Author
Falkenbach, George J.
Author_Institution
Battelle Memorial Institute, Columbus, Ohio
Volume
53
Issue
8
fYear
1965
Firstpage
1097
Lastpage
1098
Abstract
Different techniques can be used to evaluate the potential performance of radar-absorbing material (RAM). Transmission-line methods, which are based on distributed parameter measurements, are frequently used to determine its constitutive electromagnetic parameters--ε, µ and η, χ. The thin-sample and short-circuit-open-circuit (SCOC) techniques are most common in the UHF-SHF range. Although simple, the thin-sample method cannot always be used because of thickness limitations. The SCOC method, while relieving that limitation, suffers from others less understood. This paper discusses the considerations necessary in determining the parameters of RAM, and points out some limitations which must be recognized.
Keywords
Coaxial components; Conductivity; Dielectric loss measurement; Dielectric materials; Electromagnetic measurements; Electromagnetic waveguides; Loss measurement; Magnetic materials; Plasma measurements; Shape measurement;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1965.4103
Filename
1446033
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