DocumentCode
87334
Title
830-nm AlGaAs-InGaAs Graded Index Double Barrier Separate Confinement Heterostructures Laser Diodes With Improved Temperature and Divergence Characteristics
Author
Hung, Chih-Tsang ; Lu, Tien-Chang
Author_Institution
Dept. of Photonics, Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
49
Issue
1
fYear
2013
fDate
Jan. 2013
Firstpage
127
Lastpage
132
Abstract
The 830-nm AlGaAs/InGaAs laser diodes (LDs) adopting multistep-graded index double-barrier separate confinement heterostructures (GRIN-DBSCHs) with small divergence beams and improved temperature characteristics under a high-output-power operation are reported. The double-barrier separate confinement heterostructure (DBSCH) design provides good carrier confinement and prevents current leakage by adding a multistep grading layer between cladding and waveguide layers. Simultaneously, the DBSCH design can facilitate reducing the divergence angle at high-power operation and widening the transverse mode distribution to decrease the power density around emission facets. In addition, the p-side doping depth is optimized to effectively raise the barrier height for reducing the electron overflow. Gaussian-like narrow far-field patterns are measured with the full-width at half-maximum vertical divergence angle to be between 11° and 13°. A threshold current of 16.5 mA and a slop efficiency of 0.98 W/A are obtained in the continuous-wave operation condition at room temperature. The maxima optical power densities of 21.5 MW/cm2 per laser facet and good characteristic temperature values of threshold current (T0) and slope efficiency (T1) are achieved.
Keywords
III-V semiconductors; aluminium compounds; doping; gallium arsenide; gradient index optics; indium compounds; laser beams; semiconductor lasers; AlGaAs-InGaAs; GRIN-DBSCH; Gaussian-like narrow far-field patterns; barrier height; carrier confinement; cladding layers; current 16.5 mA; current leakage; electron overflow; emission facets; graded index double barrier separate confinement heterostructures; laser beam divergence; laser diodes; multistep grading layer; p-side doping depth; power density; slope efficiency; temperature 293 K to 298 K; threshold current; transverse mode distribution; waveguide layers; wavelength 830 nm; Doping; Laser beams; Optical refraction; Optical variables control; Optical waveguides; Temperature; Threshold current; AlGaAs-InGaAs heterostructure; laser beam divergence; laser diodes; quantum wells;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2012.2231053
Filename
6376083
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