Remote Measurement of Temperature in the Presence of a Strong Magnetic Field

Author

Lord, Scott Frederick ; Firebaugh, Samara L. ; Smith, Andrew N.

Author_Institution

U.S. Naval Acad., Annapolis, MD

Volume

58

Issue

3

fYear

2009

fDate

3/1/2009 12:00:00 AM

Firstpage

674

Lastpage

680

Abstract

This paper describes the development of a temperature sensor suitable for use in a pulse power system. Such systems generate large time-varying magnetic fields, which complicate instrumentation. A temperature-sensing system has been developed that can remotely capture information necessary to determine the temperature of a surface in the presence of a strong electromagnetic field. This sensor is based on an interferometer using a thin sapphire die coated with nickel and nickel oxide as the sensing element. A model was developed to predict the behavior of the sensor to determine the ideal layer thickness. With this system, temperature measurement has been demonstrated in the presence of a large time-varying magnetic field at a sampling rate of 1000 Hz over a range of 20^degC to 350^degC.

Keywords

electromagnetic fields; light interferometry; magnetic field effects; nickel; nickel compounds; optical sensors; pulsed power technology; sapphire; temperature measurement; temperature sensors; thickness measurement; thin film sensors; Al₂O₃; Ni; NiO; frequency 1000 Hz; layer thickness determination; light interferometer; pulse power system; temperature 20 degC to 350 degC; temperature measurement; temperature sensor; thin sapphire die; time-varying magnetic fields; Interferometry; nickel; pulse power systems; sapphire; temperature measurement; thin films;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2008.2005074

Filename

4633678