• DocumentCode
    874448
  • Title

    Breakdown of a thin dielectric liquid layer

  • Author

    Brosseau, Christian

  • Author_Institution
    CERMO, Univ. Joseph Fourier, Saint-Martin-d´´Heres, France
  • Volume
    27
  • Issue
    6
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    1217
  • Lastpage
    1221
  • Abstract
    Measurements of electrical breakdown on thin (10-100-μm) liquid dielectric (capacitor impregnant) layers for different interfacial situations are discussed. For this purpose a new uniform field electrode arrangement that represents interfacial conditions close to those of industrial practice was developed. It was investigated experimentally how the dielectric strength depends on such factors as electrode area, gap spacing, nature of the interface in contact with the liquid, and temperature. The breakdown phenomena are shown to be either related to high-field conduction (i.e., boiling or electrohydrodynamic cavitation leading to the generation of a vapor bubble in the prebreakdown regime) or related to the presence of particles or to local field enhancements
  • Keywords
    dielectric properties of liquids and solutions; dielectric thin films; electric breakdown of liquids; electric strength; insulating oils; insulation testing; materials testing; power capacitors; 10 to 100 micron; boiling; breakdown phenomena; capacitor impregnant; dielectric strength; electrical breakdown measurements; electrode area; electrohydrodynamic cavitation; gap spacing; high-field conduction; industrial practice; interface nature; interfacial conditions; local field enhancements; organic liquids; prebreakdown regime; presence of particles; temperature; thin dielectric liquid layer; uniform field electrode arrangement; vapor bubble; Dielectric breakdown; Dielectric liquids; Dielectric measurements; Electric breakdown; Electrodes; Partial discharges; Physics; Power capacitors; Residual stresses; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.204875
  • Filename
    204875