DocumentCode
875942
Title
Algorithm for Determining Worst Case Transistor Parameters
Author
Long, David M. ; Jaffe, Richard C. ; Casey, Richard H.
Author_Institution
Science Applications Inc. 1200 Prospect St., La Jolla, CA 92038
Volume
31
Issue
6
fYear
1984
Firstpage
1593
Lastpage
1596
Abstract
A technique for the determination of a set of Gummel - Poon tranisistor parameters is presented. Procedures for setting up the required data and the derivation of the relationships needed for the parameter extraction are given. An example that shows this procedure is given.
Keywords
Circuit analysis; Dielectric substrates; Geophysics; Laboratories; Optical wavelength conversion; Space technology; Space vehicles; Surface charging; Surface discharges; Thermal force;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1984.4333560
Filename
4333560
Link To Document