• DocumentCode
    876220
  • Title

    Reversible-logic design with online testability

  • Author

    Vasudevan, Dilip P. ; Lala, Parag K. ; Di, Jia ; Parkerson, J. Patrick

  • Author_Institution
    Dept. of Comput. Sci. & Comput. Engineeering, Univ. of Arkansas, Fayetteville, AK, USA
  • Volume
    55
  • Issue
    2
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    406
  • Lastpage
    414
  • Abstract
    Conventional digital circuits dissipate a significant amount of energy because bits of information are erased during the logic operations. Thus, if logic gates are designed such that the information bits are not destroyed, the power consumption can be reduced dramatically. The information bits are not lost in case of a reversible computation. This has led to the development of reversible gates. This paper proposes three new reversible logic gates; two of the proposed gates can be employed to design online testable reversible logic circuits. Furthermore, they can be used to implement any Boolean logic function. The application of the reversible gates in implementing several benchmark functions has been presented.
  • Keywords
    Boolean functions; design for testability; logic design; logic gates; Boolean logic function; Fredkin gate; Toffoli gate; digital circuits; garbage outputs; information bits; logic circuits design; online testability; power consumption; reversible logic design; reversible logic gates; two-pair two-rail checker; Circuit synthesis; Circuit testing; Clocks; Digital circuits; Energy consumption; Logic circuits; Logic design; Logic gates; Logic testing; System testing; Fredkin gate; Toffoli gate; garbage outputs; online testing; reversible logic; two-pair two-rail checker;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2006.870319
  • Filename
    1608582