• DocumentCode
    876632
  • Title

    (110)-oriented GaAs MESFETs

  • Author

    Pao, Y.C. ; Ou, Weiming ; Harris, J.S., Jr.

  • Author_Institution
    Varian Associates, Santa Clara, CA, USA
  • Volume
    9
  • Issue
    3
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    119
  • Lastpage
    121
  • Abstract
    GaAs metal semiconductor field-effect transistors (MESFETs) have been successfully fabricated on molecular-beam epitaxial (MBE) films grown on the off-axis
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; molecular beam epitaxial growth; semiconductor epitaxial layers; 0.12 micron; 0.18 micron; 0.4 micron; 23 GHz; 56 GHz; GaAs; MBE; MESFET devices; MESFETs; contact layer; device quality two-dimensional MBE growth; doping density; extrinsic transconductance; high-speed digital circuits; low-gate leakage current; metal semiconductor field-effect transistors; microwave power FET; output conductance; unity-current-gain cutoff frequency; Conducting materials; Cutoff frequency; Doping; FETs; Gallium arsenide; Leakage current; MESFETs; Molecular beam epitaxial growth; Semiconductor films; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.2061
  • Filename
    2061