DocumentCode
878108
Title
Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis
Author
Berg, Melanie ; Poivey, C. ; Petrick, D. ; Espinosa, D. ; Lesea, Austin ; LaBel, K.A. ; Friendlich, M. ; Kim, H. ; Phan, Anthony
Author_Institution
Goddard Space Flight Center, MEI Technol., NASA, Greenbelt, MD
Volume
55
Issue
4
fYear
2008
Firstpage
2259
Lastpage
2266
Abstract
A comparison of two scrubbing mitigation schemes for Xilinx field programmable gate array devices is presented. The design of the scrubbers is briefly discussed along with an examination of mitigation limitations. Heavy ion data are then presented and analyzed.
Keywords
field programmable gate arrays; Heavy ion data; Xilinx field programmable gate array devices; external SEU scrubbing mitigation; Aerospace electronics; Availability; Costs; Field programmable gate arrays; Flip-flops; Logic devices; Programmable logic arrays; Single event upset; Space technology; Testing; Field programmable gate array (FPGA); Xilinx; reconfiguration; scrubbing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2008.2001422
Filename
4636940
Link To Document