• DocumentCode
    878280
  • Title

    A 4096-B one-transistor per bit random-access memory with internal timing and low dissipation

  • Author

    Boonstra, Loek ; Lambrechtse, Cees W. ; Salters, Roelof H W

  • Volume
    8
  • Issue
    5
  • fYear
    1973
  • Firstpage
    305
  • Lastpage
    310
  • Abstract
    Some details of a 4096-b p-channel random-access memory with a one-transistor per bit cell are discussed. The main features of the design are the sensitive sense-refresh amplifier, allowing a storage capacitance of only 0.065 pF, application of the bootstrap principle to obtain an access time of 400 ns, a power dissipation of 150 mW, and the implementation of a new, fast shift register as an internal timing circuit. This timing circuit generates the memory clock signals, reducing the number of external clock signals to one clock and a chip select signal. The chip size is 3.01/spl times/4.44 mm/SUP 2/.
  • Keywords
    Digital integrated circuits; Random-access storage; Semiconductor storage systems; Shift registers; digital integrated circuits; random-access storage; semiconductor storage systems; shift registers; Aluminum; Circuit noise; Clocks; Parasitic capacitance; Plasma measurements; Pulse measurements; Random access memory; Read-write memory; Semiconductor device noise; Timing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1973.1050408
  • Filename
    1050408