• DocumentCode
    878295
  • Title

    Design of a high-performance 1024-B switched capacitor p-channel IGFET memory chip

  • Author

    Boll, H.J. ; Lynch, William T.

  • Volume
    8
  • Issue
    5
  • fYear
    1973
  • fDate
    10/1/1973 12:00:00 AM
  • Firstpage
    310
  • Lastpage
    318
  • Abstract
    IGFET switched-capacitor memory cells are incorporated into a fully decoded dynamic, 1024-word by 1-b p-channel random-access memory. With 10-V drive circuitry, chip access time is measured to be 150 ns and cycle time is 300 ns. Measured on-chip power dissipation at a 300 ns cycle was less than 80 mW (80 μW/b) and is correspondingly lower at lower speeds. Refresh power at 100°C is less than 1 μW/b.
  • Keywords
    Digital integrated circuits; Random-access storage; Semiconductor storage systems; digital integrated circuits; random-access storage; semiconductor storage systems; Capacitors; Decoding; Electrical engineering; Electronics packaging; Flip-flops; Horn antennas; Semiconductor device measurement; Silicon; Solid state circuits; Varactors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1973.1050409
  • Filename
    1050409