DocumentCode
878511
Title
Extended optical fiber line testing system using new eight-channel L/U-band crossed optical waveguide coupler for L-band WDM transmission
Author
Araki, Noriyuki ; Izumita, Hisashi ; Honda, Nazuki ; Nakamura, Minoru
Author_Institution
NTT Access Network Service Syst. Labs., NTT Corp., Ibaraki, Japan
Volume
21
Issue
12
fYear
2003
Firstpage
3316
Lastpage
3322
Abstract
This paper describes the system design for an extended optical fiber line testing system that uses a new L/U-band crossed optical waveguide coupler and a fiber Bragg grating filter for L-band wavelength-division multiplexing transmission. We describe the reflection characteristic required for optical filters located in central offices in order to suppress the ghost signal caused by multireflection in the optical time-domain reflectometry (OTDR) trace. We design and evaluate an eight-channel crossed optical waveguide coupler with a new thin dielectric film filter that separates a 1650-nm test light from the L-band communication light, and confirm that there was no degradation caused by multireflections in the OTDR trace. We also demonstrate the in-service line monitoring of a 10-Gb/s L-band transmission with no degradation in the transmission quality.
Keywords
Bragg gratings; optical communication equipment; optical design techniques; optical fibre couplers; optical fibre networks; optical fibre testing; optical time-domain reflectometry; optical waveguide filters; wavelength division multiplexing; 10 Gbit/s; 160 nm; L-Band WDM transmission; L-band wavelength-division multiplexing transmission; OTDR trace; eight-channel L/U-band; extended optical fiber line testing system; fiber Bragg grating filter; ghost signal suppression; in-service line monitoring; multireflection; optical filters; optical time-domain reflectometry trace; optical waveguide coupler; system design; thin dielectric film filter; Degradation; L-band; Optical coupling; Optical fiber testing; Optical fibers; Optical films; Optical filters; Optical waveguides; System testing; Wavelength division multiplexing;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2003.821761
Filename
1263751
Link To Document