• DocumentCode
    878539
  • Title

    Influence of high-optical power light launched into optical fibers in MT connector

  • Author

    Hogari, Kazuo ; Kurokawa, Kenji ; Sankawa, Izumi

  • Author_Institution
    NTT Access Network Service Syst. Labs., Ibaraki, Japan
  • Volume
    21
  • Issue
    12
  • fYear
    2003
  • Firstpage
    3344
  • Lastpage
    3348
  • Abstract
    This paper describes the influence of a high-optical power light launched into optical fibers in an mechanically transferable (MT) connector. The features of the MT connector are the use of index matching material to suppress Fresnel reflection and the accommodation of several optical fibers to allow the connection of optical fiber ribbons. First, we experimentally investigated the relationship between connection loss, launched light power, temperature increase, and optical loss increase using an MT connector sample without contamination. Based on the results, we clarified the relationship between the allowed connection loss and the launched optical power in the optical fibers needed to maintain MT connector reliability. In addition, we examined the influence of the contamination of the connector endface and confirmed that it is necessary to clean the endface appropriately in an optical transmission system that uses high-optical power light to prevent any fatal damage to the MT connector.
  • Keywords
    optical communication equipment; optical fabrication; optical fibre amplifiers; optical fibre communication; optical fibre couplers; optical fibre testing; wavelength division multiplexing; connection loss; connector endface contamination; high-optical power light; index matching material; mechanically transferable connector; optical fiber ribbons; optical transmission system; Connectors; Contamination; Fresnel reflection; Maintenance; Optical fiber losses; Optical fibers; Optical losses; Optical materials; Power system reliability; Temperature;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2003.820043
  • Filename
    1263754