DocumentCode
878670
Title
Failure mode analysis of photonic components on InP using low-coherence reflectometry: case of burned DBR lasers
Author
Plouzennec, C. ; Gottesman, Y. ; Rao, E.V.K. ; Sillard, H. ; Plais, A. ; Jacquet, J.
Author_Institution
CNRS-LPN, Sens, France
Volume
21
Issue
12
fYear
2003
Firstpage
3434
Lastpage
3440
Abstract
The high potential of optical low-coherence reflectometry to investigate the failure mode of InP-based optical devices is demonstrated here by considering two examples of burned (under high optical output power and operating temperature) distributed Bragg reflector lasers on InP. In addition to monitoring reflections in the conventional reflection mode, these two-section devices (active amplifier section and passive Bragg section) are further examined using other in-situ facilities such as the transmission and edge electroluminescence measurements. A comprehensive analysis of these data in comparison to a reference device permitted the following: 1) the spatial localization of burning induced damage only in the amplifier section; 2) some relevant information on the nature of defects in the damaged region, such as their nonradiative character and structural modifications in multiquantum wells, which tentatively are attributed to the occurrence of intermixing between well and barrier layers.
Keywords
Bragg gratings; distributed Bragg reflector lasers; electroluminescence; failure analysis; integrated optics; optical communication equipment; optical fibre communication; quantum well lasers; reflectometry; semiconductor device reliability; wavelength division multiplexing; InP; InP photonic components; active amplifier; burned DBR lasers; edge electroluminescence; failure mode analysis; low-coherence reflectometry; multiquantum wells; passive Bragg; spatial localization; transmission electroluminescence; Distributed Bragg reflectors; Failure analysis; Indium phosphide; Laser modes; Optical amplifiers; Optical devices; Optical reflection; Power generation; Reflectometry; Stimulated emission;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2003.821757
Filename
1263766
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