• DocumentCode
    878670
  • Title

    Failure mode analysis of photonic components on InP using low-coherence reflectometry: case of burned DBR lasers

  • Author

    Plouzennec, C. ; Gottesman, Y. ; Rao, E.V.K. ; Sillard, H. ; Plais, A. ; Jacquet, J.

  • Author_Institution
    CNRS-LPN, Sens, France
  • Volume
    21
  • Issue
    12
  • fYear
    2003
  • Firstpage
    3434
  • Lastpage
    3440
  • Abstract
    The high potential of optical low-coherence reflectometry to investigate the failure mode of InP-based optical devices is demonstrated here by considering two examples of burned (under high optical output power and operating temperature) distributed Bragg reflector lasers on InP. In addition to monitoring reflections in the conventional reflection mode, these two-section devices (active amplifier section and passive Bragg section) are further examined using other in-situ facilities such as the transmission and edge electroluminescence measurements. A comprehensive analysis of these data in comparison to a reference device permitted the following: 1) the spatial localization of burning induced damage only in the amplifier section; 2) some relevant information on the nature of defects in the damaged region, such as their nonradiative character and structural modifications in multiquantum wells, which tentatively are attributed to the occurrence of intermixing between well and barrier layers.
  • Keywords
    Bragg gratings; distributed Bragg reflector lasers; electroluminescence; failure analysis; integrated optics; optical communication equipment; optical fibre communication; quantum well lasers; reflectometry; semiconductor device reliability; wavelength division multiplexing; InP; InP photonic components; active amplifier; burned DBR lasers; edge electroluminescence; failure mode analysis; low-coherence reflectometry; multiquantum wells; passive Bragg; spatial localization; transmission electroluminescence; Distributed Bragg reflectors; Failure analysis; Indium phosphide; Laser modes; Optical amplifiers; Optical devices; Optical reflection; Power generation; Reflectometry; Stimulated emission;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2003.821757
  • Filename
    1263766