Proton-induced transients and charge collection measurements in a LWIR HgCdTe focal plane array

Author

Marshall, Paul W. ; Hubbs, John E. ; Arrington, Douglas C. ; Marshall, Cheryl J. ; Reed, Robert A. ; Gee, George ; Pickel, James C. ; Ramos, Rodolfo A.

Author_Institution

NASA Goddard Space Flight Center, Brookneal, VA, USA

Volume

50

Issue

6

fYear

2003

Firstpage

1968

Lastpage

1973

Abstract

We compare measurements and modeling of 27 and 63 MeV proton-induced transients in a large-format HgCdTe long wavelength infrared (LWIR) focal plane assembly operating at 40 K. Charge collection measurements describe very limited diffusion of carriers to multiple pixels showing significantly reduced particle induced cross-talk for the lateral diffusion structure.

Keywords

II-VI semiconductors; cadmium compounds; focal planes; mercury compounds; proton effects; radiation hardening (electronics); 27 MeV; 40 K; 63 MeV; HgCdTe; LWIR HgCdTe focal plane array; charge collection measurements; lateral diffusion structure; long wavelength infrared focal plane assembly; multiple pixels; particle induced cross-talk; proton-induced transients; Charge measurement; Current measurement; Diodes; Extraterrestrial measurements; Laboratories; NASA; Protons; Radiation effects; Space technology; Wavelength measurement;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2003.820749

Filename

1263829