• DocumentCode
    880218
  • Title

    Selecting concise training sets from clean data

  • Author

    Plutowski, Mark ; White, Halbert

  • Author_Institution
    California Univ., San Diego, CA, USA
  • Volume
    4
  • Issue
    2
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    305
  • Lastpage
    318
  • Abstract
    The authors derive a method for selecting exemplars for training a multilayer feedforward network architecture to estimate an unknown (deterministic) mapping from clean data, i.e., data measured either without error or with negligible error. The objective is to minimize the data requirement of learning. The authors choose a criterion for selecting training examples that works well in conjunction with the criterion used for learning, here, least squares. They proceed sequentially, selecting an example that, when added to the previous set of training examples and learned, maximizes the decrement of network squared error over the input space. When dealing with clean data and deterministic relationships, concise training sets that minimize the integrated squared bias (ISB) are desired. The ISB is used to derive a selection criterion for evaluating individual training examples, the DISB, that is maximized to select new exemplars. They conclude with graphical illustrations of the method, and demonstrate its use during network training. Experimental results indicate that training upon exemplars selected in this fashion can save computation in general purpose use as well
  • Keywords
    feedforward neural nets; learning (artificial intelligence); clean data; concise training sets selection; integrated squared bias; least squares; mapping; multilayer feedforward network architecture; network training; neural nets; Computer science; Costs; Data compression; Data engineering; Helium; Interpolation; Least squares methods; Neural networks; Nonhomogeneous media; State estimation;
  • fLanguage
    English
  • Journal_Title
    Neural Networks, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1045-9227
  • Type

    jour

  • DOI
    10.1109/72.207618
  • Filename
    207618