DocumentCode
880382
Title
Improved micro thermal shear-stress sensor
Author
Huang, Jin-Biao ; Tung, Steve ; Ho, Chih-Ming ; Liu, Chang ; Tai, Yu-Chong
Author_Institution
Centre for Microsyst., California Univ., Los Angeles, CA, USA
Volume
45
Issue
2
fYear
1996
fDate
4/1/1996 12:00:00 AM
Firstpage
570
Lastpage
574
Abstract
Micro hot-film shear-stress sensors have been designed and fabricated by surface micromachining technology which is compatible with IC technology. A polysilicon strip, 2 μm×80 μm, is deposited on top of a thin silicon nitride film and functions as the sensor element. By using the sacrificial-layer technique, a cavity (a vacuum chamber of about 300 mtorr), 200×200×2 μm, is placed between the silicon nitride film and the silicon substrate. This cavity significantly increases the sensitivity of the sensor by reducing the heat loss to the substrate. The frequency response of the sensor, however, is degraded by the cavity. For comparison purposes, a sensor structure without a cavity has also been designed and fabricated on the same chip. When operated in a constant temperature mode, the cutoff frequencies of the sensors with and without a cavity can reach 9 and 130 kHz, respectively. Wind tunnel calibration of the sensor with a cavity shows a sensitivity of about 10 mV/Pa, which is about two orders of magnitude higher than other micromachined shear stress sensors
Keywords
calibration; elemental semiconductors; heat transfer; integrated circuit modelling; integrated circuit technology; microsensors; shear strength; silicon; silicon compounds; stress measurement; 130 kHz; 2 mum; 200 mum; 300 mtorr; 80 mum; 9 kHz; IC technology; Si; Si substrate; Si3N4 film; Si3N4-Si; cavity; constant temperature mode; cutoff frequencies; frequency response; heat loss; hot-film shear-stress sensors; micro thermal shear-stress sensor; polysilicon strip; sacrificial-layer technique; sensitivity; surface micromachining; thin silicon nitride film; vacuum chamber; wind tunnel calibration; Frequency response; Micromachining; Semiconductor films; Silicon; Strips; Substrates; Temperature sensors; Thermal sensors; Thin film sensors; Vacuum technology;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.492789
Filename
492789
Link To Document