• DocumentCode
    880486
  • Title

    Effect of additive dither on the resolution of ADC´s with single-bit or multibit errors

  • Author

    Wagdy, Mahmoud Fawzy

  • Author_Institution
    California State Univ., Long Beach, CA, USA
  • Volume
    45
  • Issue
    2
  • fYear
    1996
  • fDate
    4/1/1996 12:00:00 AM
  • Firstpage
    610
  • Lastpage
    615
  • Abstract
    The topic of this paper is to investigate the effects of additive dither on nonideal ADC´s, i.e., ADC´s with nonlinearity errors. To that end, the nonideal ADC transfer characteristics are considered as a superposition of the ideal characteristics plus nonlinearity errors. First, the factor “D” developed previously to assess the deviation of the transfer characteristics from the unity-gain line, is revisited. The nonlinearity spectra of the ideal quantization error function are then rederived using the appropriate scale factor. Second,“D” is derived for an ADC with an error in any single bit. Some example dither forms, i.e., with various probability density functions (PDF´s) are considered. Effects of dither for different error levels and bit orders are investigated, and the added resolution is computed. Third, the paper investigates the effects of dither on ADC´s with errors in more than one bit. The deviation factor “D” is derived, which makes it possible to compute the added resolution. The paper thus presents, for the first time, a novel technique for quantifying the performance of ADC´s with multibit errors, in the presence of added dither
  • Keywords
    analogue-digital conversion; error analysis; performance evaluation; probability; transfer functions; ADC; additive dither; deviation factor; ideal quantization error function; multibit errors; nonideal ADC transfer characteristics; nonlinearity error; nonlinearity errors; nonlinearity spectra; probability density functions; resolution; scale factor; single-bit errors; superposition; Additive noise; Equations; Fourier transforms; MATLAB; Probability density function; Quantization; Signal processing; Signal resolution; Software tools; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.492797
  • Filename
    492797