• DocumentCode
    881239
  • Title

    Plasma Screening of Funnel Fields

  • Author

    Gilbert, R. M. ; Ovrebo, G. K. ; Schifano, J.

  • Author_Institution
    Harry Diamond Laboratories Adelphi, MD 20783
  • Volume
    32
  • Issue
    6
  • fYear
    1985
  • Firstpage
    4097
  • Lastpage
    4103
  • Abstract
    A plasma screening factor has been added to the McLean-Oldham effective funnel length model. Based on the skin depth concept, the factor is intended to provide for plasma screening of funnel fields in heavy-ion tracks crossing reverse-biased silicon and gallium arsenide junctions. Comparisons between screened-funnel predictions of prompt charge collection and experimental data show improved predictive accuracy at low and intermediate values of junction bias.
  • Keywords
    Alpha particles; Copper; Gallium arsenide; Ionization; Plasma displays; Predictive models; Schottky diodes; Semiconductor diodes; Silicon; Skin;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1985.4334075
  • Filename
    4334075