Statistical integrated circuit design

Author

Director, Stephen W. ; Feldmann, Peter ; Krishna, Kannan

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

28

Issue

3

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

193

Lastpage

202

Abstract

Several statistical design methods that have been developed to minimize the effects of IC manufacturing process disturbances on circuit performance are reviewed. It is shown that statistical design problems can be expressed as optimization problems in which either the objective function or the constraint functions depend on expectations of random variables. The effectiveness of the most recent such method, the boundary integral method is illustrated with several circuit design examples

Keywords

circuit CAD; design engineering; integrated circuit manufacture; monolithic integrated circuits; optimisation; statistical analysis; IC manufacturing process disturbances; boundary integral method; circuit design examples; constraint functions; integrated circuit design; objective function; optimization problems; statistical design methods; statistical design problems; yield maximisation; Circuit optimization; Design methodology; Distributed amplifiers; Fluctuations; Integral equations; Integrated circuit synthesis; Integrated circuit yield; Manufacturing processes; Performance gain; Temperature;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.209985

Filename

209985