• DocumentCode
    881756
  • Title

    Electrically erasable nonvolatile optical MNOS memory device

  • Author

    Koike, Susumu ; Kambara, Ginjiro

  • Volume
    11
  • Issue
    2
  • fYear
    1976
  • fDate
    4/1/1976 12:00:00 AM
  • Firstpage
    303
  • Lastpage
    307
  • Abstract
    A new type of nonvolatile optical memory device composed of a MNOS FET with a photosensitive region is proposed. Based upon charge transport induced by voltage change across a double insulator layer under illumination, the present device can be operated in a broad wavelength spectrum from the infrared to the visible region when provided with a d.c. bias voltage. It is found that the charge transport is a function of the exposure time as well as of the intensity of the incident light. An operation mechanism is proposed based upon the experimental results.
  • Keywords
    Field effect transistors; Monolithic integrated circuits; Optical storage devices; Semiconductor storage devices; field effect transistors; monolithic integrated circuits; optical storage devices; semiconductor storage devices; FETs; Insulation; Lighting; Nonvolatile memory; Optical character recognition software; Optical devices; Optical sensors; Substrates; Voltage; Writing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1976.1050718
  • Filename
    1050718