DocumentCode
882414
Title
Extended temperature range for the maximum dielectric strength
Author
Klein, N.
Volume
54
Issue
7
fYear
1966
fDate
7/1/1966 12:00:00 AM
Firstpage
979
Lastpage
980
Keywords
Breakdown voltage; Capacitors; Dielectric breakdown; Dielectric measurements; Dielectric thin films; Electric breakdown; Helium; Silicon; Temperature distribution; Thermal conductivity;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1966.4945
Filename
1446875
Link To Document