• DocumentCode
    882416
  • Title

    Radiation damage and annealing in GaAs solar cells

  • Author

    Loo, Robert Y. ; Kamath, G. Sanjiv ; Li, Sheng S.

  • Author_Institution
    Hughes Res. Lab., Malibu, CA, USA
  • Volume
    37
  • Issue
    2
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    485
  • Lastpage
    497
  • Abstract
    Work on radiation damage and annealing of GaAs cells for space power applications is reviewed. The performance of cells before and after irradiation and after thermal annealing is correlated to the nature and density of defect centers identified using deep-level transient spectroscopy techniques. Two important deep levels are present in electron- and proton-irradiated GaAs cells (Ec -0.71 eV and Ev +0.71 eV). The data from periodic and continuous annealing experiments show that GaAs cells are more radiation resistant than silicon and that the damage can be annealed at temperatures as low as 200°C. On the basis of these data, specific annealing schedules that can greatly enhance the end-of-life efficiency of the cells for specific missions can be designed for GaAs solar panels
  • Keywords
    III-V semiconductors; annealing; deep level transient spectroscopy; deep levels; electron beam effects; electron traps; gallium arsenide; hole traps; proton effects; solar cells; space vehicle power plants; 200 degC; DLTS; GaAs solar cells; III-V semiconductor; annealing schedules; deep levels; deep-level transient spectroscopy; electron traps; end-of-life efficiency; hole traps; radiation damage; solar panels; space power applications; thermal annealing; Annealing; Costs; Electrons; Gallium arsenide; Photovoltaic cells; Power conversion; Protons; Silicon; Silver; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.46387
  • Filename
    46387