DocumentCode
882416
Title
Radiation damage and annealing in GaAs solar cells
Author
Loo, Robert Y. ; Kamath, G. Sanjiv ; Li, Sheng S.
Author_Institution
Hughes Res. Lab., Malibu, CA, USA
Volume
37
Issue
2
fYear
1990
fDate
2/1/1990 12:00:00 AM
Firstpage
485
Lastpage
497
Abstract
Work on radiation damage and annealing of GaAs cells for space power applications is reviewed. The performance of cells before and after irradiation and after thermal annealing is correlated to the nature and density of defect centers identified using deep-level transient spectroscopy techniques. Two important deep levels are present in electron- and proton-irradiated GaAs cells (E c -0.71 eV and E v +0.71 eV). The data from periodic and continuous annealing experiments show that GaAs cells are more radiation resistant than silicon and that the damage can be annealed at temperatures as low as 200°C. On the basis of these data, specific annealing schedules that can greatly enhance the end-of-life efficiency of the cells for specific missions can be designed for GaAs solar panels
Keywords
III-V semiconductors; annealing; deep level transient spectroscopy; deep levels; electron beam effects; electron traps; gallium arsenide; hole traps; proton effects; solar cells; space vehicle power plants; 200 degC; DLTS; GaAs solar cells; III-V semiconductor; annealing schedules; deep levels; deep-level transient spectroscopy; electron traps; end-of-life efficiency; hole traps; radiation damage; solar panels; space power applications; thermal annealing; Annealing; Costs; Electrons; Gallium arsenide; Photovoltaic cells; Power conversion; Protons; Silicon; Silver; Temperature distribution;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.46387
Filename
46387
Link To Document