• DocumentCode
    882814
  • Title

    Modeling of the low-frequency base resistance of single base contact bipolar transistors

  • Author

    Schröter, M.

  • Author_Institution
    Ruhr-Univ. Bochum, Germany
  • Volume
    39
  • Issue
    8
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    1966
  • Lastpage
    1968
  • Abstract
    The current and geometry dependence of the base resistance of single base contact (SBC) bipolar transistors is accurately modeled by extending the simple analytical formulas given by T. Ohzone et al. (1985). The results show that SBC transistors only seem to be useful if the ratio of emitter width b to emitter length l is larger than about 1/5. Of course, this limit depends on technology and circuit application
  • Keywords
    bipolar transistors; contact resistance; semiconductor device models; 2D transistor simulation; DEVICE; SBC transistors; analytical formulas; emitter length; emitter width; geometry dependence; low frequency base resistance modelling; single base contact bipolar transistors; Bipolar transistors; Circuits; Conductivity; Contact resistance; Current density; Geometry; Proximity effect; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.144691
  • Filename
    144691