DocumentCode
882814
Title
Modeling of the low-frequency base resistance of single base contact bipolar transistors
Author
Schröter, M.
Author_Institution
Ruhr-Univ. Bochum, Germany
Volume
39
Issue
8
fYear
1992
fDate
8/1/1992 12:00:00 AM
Firstpage
1966
Lastpage
1968
Abstract
The current and geometry dependence of the base resistance of single base contact (SBC) bipolar transistors is accurately modeled by extending the simple analytical formulas given by T. Ohzone et al. (1985). The results show that SBC transistors only seem to be useful if the ratio of emitter width b to emitter length l is larger than about 1/5. Of course, this limit depends on technology and circuit application
Keywords
bipolar transistors; contact resistance; semiconductor device models; 2D transistor simulation; DEVICE; SBC transistors; analytical formulas; emitter length; emitter width; geometry dependence; low frequency base resistance modelling; single base contact bipolar transistors; Bipolar transistors; Circuits; Conductivity; Contact resistance; Current density; Geometry; Proximity effect; Solid modeling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.144691
Filename
144691
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