DocumentCode
883342
Title
Accurate Characterization of Shielding Effectiveness of Metallic Enclosures With Thin Wires and Thin Slots
Author
Liu, Qi-Feng ; Yin, Wen-Yan ; Mao, Jun-Fa ; Chen, Zhizhang
Author_Institution
Sch. of Electron. Inf. & Electr. Eng., Shanghai Jiao Tong Univ., Shanghai
Volume
51
Issue
2
fYear
2009
fDate
5/1/2009 12:00:00 AM
Firstpage
293
Lastpage
300
Abstract
In many electrical and electronic systems, metallic enclosures are used to provide electromagnetic shielding. These enclosures normally contain thin wires, thin slots, and frequency-selective slots (FSS) that degrade the shielding effects. In this paper, integrated FDTD formulations are developed that can model both subcellular thin slots and thin wires simultaneously. The formulations are shown to be capable of accurately predicting shielding effectiveness and inner field distributions of a metallic enclosure in both the frequency- and time-domains when subject to a high-power electromagnetic pulse.
Keywords
electromagnetic shielding; finite difference time-domain analysis; frequency selective surfaces; electromagnetic shielding; frequency-selective slots; integrated FDTD formulations; metallic enclosures; shielding effectiveness; thin slots; thin wires; Degradation; EMP radiation effects; Electromagnetic coupling; Electromagnetic heating; Electromagnetic scattering; Electromagnetic shielding; Finite difference methods; Frequency; Time domain analysis; Wires; Finite-difference time-domain (FDTD); frequency-selective slot units; high-power electromagnetic pulse (HP-EMP); inner field distribution; shielding effectiveness; thin-slot formula (TSF); thin-wire formula (TWF);
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2008.927942
Filename
4639140
Link To Document