• DocumentCode
    883342
  • Title

    Accurate Characterization of Shielding Effectiveness of Metallic Enclosures With Thin Wires and Thin Slots

  • Author

    Liu, Qi-Feng ; Yin, Wen-Yan ; Mao, Jun-Fa ; Chen, Zhizhang

  • Author_Institution
    Sch. of Electron. Inf. & Electr. Eng., Shanghai Jiao Tong Univ., Shanghai
  • Volume
    51
  • Issue
    2
  • fYear
    2009
  • fDate
    5/1/2009 12:00:00 AM
  • Firstpage
    293
  • Lastpage
    300
  • Abstract
    In many electrical and electronic systems, metallic enclosures are used to provide electromagnetic shielding. These enclosures normally contain thin wires, thin slots, and frequency-selective slots (FSS) that degrade the shielding effects. In this paper, integrated FDTD formulations are developed that can model both subcellular thin slots and thin wires simultaneously. The formulations are shown to be capable of accurately predicting shielding effectiveness and inner field distributions of a metallic enclosure in both the frequency- and time-domains when subject to a high-power electromagnetic pulse.
  • Keywords
    electromagnetic shielding; finite difference time-domain analysis; frequency selective surfaces; electromagnetic shielding; frequency-selective slots; integrated FDTD formulations; metallic enclosures; shielding effectiveness; thin slots; thin wires; Degradation; EMP radiation effects; Electromagnetic coupling; Electromagnetic heating; Electromagnetic scattering; Electromagnetic shielding; Finite difference methods; Frequency; Time domain analysis; Wires; Finite-difference time-domain (FDTD); frequency-selective slot units; high-power electromagnetic pulse (HP-EMP); inner field distribution; shielding effectiveness; thin-slot formula (TSF); thin-wire formula (TWF);
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2008.927942
  • Filename
    4639140