• DocumentCode
    883356
  • Title

    Temperature coefficient of resolution of lateral bipolar magnetotransistors

  • Author

    Kung, William ; Nathan, Arokia

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
  • Volume
    40
  • Issue
    5
  • fYear
    1993
  • fDate
    5/1/1993 12:00:00 AM
  • Firstpage
    910
  • Lastpage
    917
  • Abstract
    The authors present measurement results of the temperature coefficient (TC) of magnetic field resolution Bmin for dual-collector lateral bipolar magnetotransistors (MTs)-over a temperature range 273 K⩽T⩽373 K. For a bandwidth of 500 Hz centered around 750 Hz, the resolution turns out to be 600 nT at room temperature with a TC of +2.3×10-3/K. With the MT operating in medium injection, there is very little dependence of B min on bias conditions. In this regime, the correlation (Γ) between collector noise currents is the highest (near unity), where the forward current gain β of the MT is at its maximum. At higher injection levels, a degradation in Γ is observed, possibly due to emitter crowding effects, behaving in a manner similar to β. The degree of coherence appears to be dependent on frequency; Γ is higher at low frequencies where the base 1/f noise predominates and Γ degrades at higher frequencies when white noise levels from the collector epi region become significant
  • Keywords
    bipolar transistors; electric sensing devices; magnetic field measurement; random noise; semiconductor device noise; white noise; 273 to 373 K; 500 Hz; base 1/f noise; collector epi region; collector noise currents; degree of coherence; emitter crowding effects; forward current gain; lateral bipolar magnetotransistors; magnetic field sensor; medium injection; temperature coefficient of resolution; white noise levels; Degradation; Frequency; Magnetic devices; Magnetic field measurement; Magnetic fields; Magnetic sensors; Signal to noise ratio; Spatial resolution; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.210198
  • Filename
    210198