DocumentCode

883509

Title

Noise behavior of avalanching silicon diodes

Author

Minden, H.T.

Volume

54

Issue

8

fYear

1966

Firstpage

1124

Lastpage

1125

Keywords

Diodes; Electric breakdown; Fires; Noise measurement; P-n junctions; Power measurement; Resistors; Silicon; Space vector pulse width modulation; Voltage;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1966.5048

Filename

1446978