DocumentCode
885968
Title
An experimental 64-bit decoded Josephson NDRO random access memory
Author
Henkels, Walter H. ; Zappe, Hans H.
Volume
13
Issue
5
fYear
1978
Firstpage
591
Lastpage
600
Abstract
The design and testing of an experimental fully decoded 64-bit Josephson NDRO (nondestructive readout) RAM chip are described. Tree decoders were used to access the memory cells. The basic memory cell was a ring cell containing a single write gate. The chips were built in a coarse 25 /spl mu/m technology since neither speed nor density were stressed in this study. An access time of 4 ns with full margins and of 2.3 ns with reduced margins were demonstrated. The corresponding full memory cycle times were 5 and 3.5 ns, respectively. Good agreement with computer simulations was obtained throughout.
Keywords
Integrated circuit technology; Integrated memory circuits; Josephson effect; Random-access storage; Superconducting junction devices; Thin film circuits; integrated circuit technology; integrated memory circuits; random-access storage; superconducting junction devices; thin film circuits; Circuit testing; Computer simulation; Decoding; Josephson junctions; Logic circuits; Random access memory; Resistors; Superconductivity; Switches;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1978.1051105
Filename
1051105
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