DocumentCode
886028
Title
Estimation of junction depths in double-diffused transistors
Author
Thomas, R.E. ; Boothroyd, A.R.
Volume
54
Issue
12
fYear
1966
Firstpage
1944
Lastpage
1945
Keywords
Area measurement; Avalanche breakdown; Breakdown voltage; Capacitance measurement; Circuits; Density measurement; Doping; Impedance; Particle measurements; Transmission line theory;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1966.5279
Filename
1447209
Link To Document