Direct dispersion measurement of highly-erbium-doped optical amplifiers using a low coherence reflectometer coupled with dispersive fourier spectroscopy

Author

Takada, Kazumasa ; Kitagawa, Tomotaka ; Hattori, K. ; Yamada, Makoto ; Horiguchi, M.

Author_Institution

NTT Opto Electron. Labs., NTT Corp., Ibaraki, Japan

Volume

28

Issue

20

fYear

1992

Firstpage

1889

Lastpage

1891

Abstract

The group delay and dispersion, including the erbium ion contributions, of the highly erbium-doped silica planar waveguide amplifier and multicomponent glass fibre amplifiers are directly measured at different pump powers using a low coherence reflectometer and dispersive Fourier spectroscopy. This method derives the refractive index spectra of these amplifiers directly from the produced reflectograms without any physical or mathematical assumptions. The dispersion of the planar waveguide amplifier at 500 mW pumping changes between +300 and -200 ps/km/nm with a 0.4 wt.% erbium concentration.

Keywords

Fourier transform spectra; Fourier transform spectroscopy; erbium; fibre lasers; laser variables measurement; optical dispersion; optical testing; optical variables measurement; optical waveguides; reflectometry; refractive index; solid lasers; 500 mW; Er doped optical fibre; Er ion concentration; SiO₂:Er; dispersive fourier spectroscopy; group delay; low coherence reflectometer; multicomponent glass fibre amplifiers; optical amplifiers; planar waveguide amplifier; pump powers; reflectograms; refractive index spectra;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:19921209

Filename

161235