• DocumentCode
    886633
  • Title

    Microwave measurements Part I: Linear Measurements

  • Author

    Pirola, Marco ; Teppati, Valeria ; Camarchia, Vittorio

  • Volume
    10
  • Issue
    2
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    14
  • Lastpage
    19
  • Abstract
    By convention, radio frequency (RF) and microwave frequencies range between 30 MHz and 300 GHz. Conversely, this means their wavelengths range between 10 m and 1 mm. Intense research in radar development during World War II extended the RF spectrum beyond the usual applications in radio communications. The use of shorter wavelengths resulted in laboratory equipment with proportionally smaller dimensions to generate, convey, transmit, and detect higher-frequency signals. Wavelengths shorter than 1 mm require equipment too small to be realized. Voltage, current, and impedance concepts lose their conventional meanings when the operating wavelength is approximately equal to the dimensions of the structures under test. The behavior of propagating electromagnetic waves must then be analyzed in terms of electric and magnetic field. Unfortunately, no simple and direct way exists to measure these quantities, so we must resort to indirect methods. In the following sections, we briefly review the concept and need for measurements of scattering parameters. We also describe the two key instruments for microwave measurements: VNAs and spectrum analyzers.
  • Keywords
    S-parameters; electric fields; magnetic fields; microwave measurement; network analysers; radiowave propagation; spectral analysers; 0.03 to 300 GHz; 10000 to 1 mm; RF spectrum; electric field; electromagnetic wave propagation; linear measurements; magnetic field; microwave measurements; radio communications; scattering parameters; spectrum analyzers; vector network analyzers; Electromagnetic measurements; Laboratories; Magnetic field measurement; Microwave frequencies; Microwave measurements; Radar applications; Radio communication; Radio frequency; Wavelength conversion; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2007.364959
  • Filename
    4213132