DocumentCode
886633
Title
Microwave measurements Part I: Linear Measurements
Author
Pirola, Marco ; Teppati, Valeria ; Camarchia, Vittorio
Volume
10
Issue
2
fYear
2007
fDate
4/1/2007 12:00:00 AM
Firstpage
14
Lastpage
19
Abstract
By convention, radio frequency (RF) and microwave frequencies range between 30 MHz and 300 GHz. Conversely, this means their wavelengths range between 10 m and 1 mm. Intense research in radar development during World War II extended the RF spectrum beyond the usual applications in radio communications. The use of shorter wavelengths resulted in laboratory equipment with proportionally smaller dimensions to generate, convey, transmit, and detect higher-frequency signals. Wavelengths shorter than 1 mm require equipment too small to be realized. Voltage, current, and impedance concepts lose their conventional meanings when the operating wavelength is approximately equal to the dimensions of the structures under test. The behavior of propagating electromagnetic waves must then be analyzed in terms of electric and magnetic field. Unfortunately, no simple and direct way exists to measure these quantities, so we must resort to indirect methods. In the following sections, we briefly review the concept and need for measurements of scattering parameters. We also describe the two key instruments for microwave measurements: VNAs and spectrum analyzers.
Keywords
S-parameters; electric fields; magnetic fields; microwave measurement; network analysers; radiowave propagation; spectral analysers; 0.03 to 300 GHz; 10000 to 1 mm; RF spectrum; electric field; electromagnetic wave propagation; linear measurements; magnetic field; microwave measurements; radio communications; scattering parameters; spectrum analyzers; vector network analyzers; Electromagnetic measurements; Laboratories; Magnetic field measurement; Microwave frequencies; Microwave measurements; Radar applications; Radio communication; Radio frequency; Wavelength conversion; Wavelength measurement;
fLanguage
English
Journal_Title
Instrumentation & Measurement Magazine, IEEE
Publisher
ieee
ISSN
1094-6969
Type
jour
DOI
10.1109/MIM.2007.364959
Filename
4213132
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