Microwave dielectric constant of a low temperature cofired ceramic

Author

Gipprich, John W. ; Leahy, Kevin A. ; Martin, Angela J. ; Rich, Edward L., III ; Sparks, Keith W.

Author_Institution

Westinghouse Electr. Corp., Baltimore, MD, USA

Volume

14

Issue

4

fYear

1991

fDate

12/1/1991 12:00:00 AM

Firstpage

732

Lastpage

737

Abstract

Evaluation of low-temperature, cofired ceramic multilayer packaging material at microwave frequencies has revealed a lower dielectric constant than the standard measurement at 1 MHz. Examination of resonance comparisons in both the authors´ and in previously published work suggests similar conclusions. Measurements using various resonators produced results in agreement with the derivations from other indirect methods. Time-domain network measurements on microstrip structures designed with the 1-MHz dielectric constant and on revised structures using the dielectric constant are in agreement with the measured values. A functional three-dimensional test structure is described

Keywords

ceramics; dielectric loss measurement; microwave measurement; packaging; permittivity measurement; strip lines; 45 MHz to 18 GHz; ceramic multilayer packaging material; dielectric constant; loss tangent; low temperature cofired ceramic; microstrip structures; microwave frequencies; relative permittivity; resonators; three-dimensional test structure; time domain network measurements; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Measurement standards; Microwave frequencies; Microwave measurements; Nonhomogeneous media; Packaging; Temperature;

fLanguage

English

Journal_Title

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on

Publisher

ieee

ISSN

0148-6411

Type

jour

DOI

10.1109/33.105125

Filename

105125