• DocumentCode
    887886
  • Title

    ITC 2005 panels

  • Author

    Stolicny, Carol

  • Author_Institution
    Intel
  • Volume
    23
  • Issue
    2
  • fYear
    2006
  • Firstpage
    164
  • Lastpage
    166
  • Abstract
    Summaries of panel sessions from the 2005 International Test Conference.
  • Keywords
    ITC 2005; International Test Conference; design for testability; multicore testing; soft errors; test compression; Costs; Design for testability; Europe; Graphics; Instruments; Multicore processing; Outsourcing; Personnel; Protection; Testing; ITC 2005; International Test Conference; design for testability; multicore testing; soft errors; test compression;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.45
  • Filename
    1613802