DocumentCode
887886
Title
ITC 2005 panels
Author
Stolicny, Carol
Author_Institution
Intel
Volume
23
Issue
2
fYear
2006
Firstpage
164
Lastpage
166
Abstract
Summaries of panel sessions from the 2005 International Test Conference.
Keywords
ITC 2005; International Test Conference; design for testability; multicore testing; soft errors; test compression; Costs; Design for testability; Europe; Graphics; Instruments; Multicore processing; Outsourcing; Personnel; Protection; Testing; ITC 2005; International Test Conference; design for testability; multicore testing; soft errors; test compression;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2006.45
Filename
1613802
Link To Document