• DocumentCode
    888822
  • Title

    An Ultra Low Energy 12-bit Rate-Resolution Scalable SAR ADC for Wireless Sensor Nodes

  • Author

    Verma, Naveen ; Chandrakasan, Anantha P.

  • Author_Institution
    Microsystems Technol. Lab., MIT, Cambridge, MA
  • Volume
    42
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    1196
  • Lastpage
    1205
  • Abstract
    A resolution-rate scalable ADC for micro-sensor networks is described. Based on the successive approximation register (SAR) architecture, this ADC has two resolution modes: 12 bit and 8 bit, and its sampling rate is scalable, at a constant figure-of-merit, from 0-100 kS/s and 0-200 kS/s, respectively. At the highest performance point (i.e., 12 bit, 100 kS/s), the entire ADC (including digital, analog, and reference power) consumes 25 muW from a 1-V supply. The ADC´s CMRR is enhanced by common-mode independent sampling and passive auto-zero reference generation. The efficiency of the comparator is improved by an analog offset calibrating latch, and the preamplifier settling time is relaxed by self-timing the bit-decisions. Prototyped in a 0.18-mum, 5M2P CMOS process, the ADC, at 12 bit, 100 kS/s, achieves a Nyquist SNDR of 65 dB (10.55 ENOB) and an SFDR of 71 dB. Its INL and DNL are 0.68 LSB and 0.66 LSB, respectively
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; low-power electronics; microsensors; wireless sensor networks; 0.18 micron; 1 V; 25 muW; 5M2P CMOS process; ADC; analog offset calibrating latch; analog-to-digital conversion; bit-decisions; circuit noise; common-mode independent sampling; comparator efficiency; low-power electronics; microsensor networks; offset compensation; passive auto-zero reference generation; reference power; self-timing; successive approximation register; wireless sensor nodes; Analog-digital conversion; Circuits; Energy resolution; Intelligent sensors; Latches; Monitoring; Prototypes; Sampling methods; Sensor phenomena and characterization; Wireless sensor networks; ADC; CMOS analog integrated circuits; analog-to-digital conversion; circuit noise; low-power electronics; offset compensation; scaleable; successive approximation register;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2007.897157
  • Filename
    4214985