DocumentCode
890733
Title
An integrated MSI crosspoint array
Author
Blachere, Jean-Marie ; Benichou, Claude ; Braquet, Henri J.
Volume
16
Issue
3
fYear
1981
fDate
6/1/1981 12:00:00 AM
Firstpage
205
Lastpage
211
Abstract
A 144-element array of crosspoint switches has been fabricated. With a total insertion loss of 0.04 dB on a 600 /spl Omega/ load and an off state capacitance of 0.4 pF the chip can be used in large switching systems. The crosspoint has a breakdown voltage of 40 V, a holding current of 800 /spl mu/A. A good immunity against transient pulses is achieved by a high dynamic breakdown: typically 3.5 V/ns. The design uses the conventional buried collector technology and the interconnection requires two levels of metal. The process has been optimized to maintain the substrate leakage factor lower than 6.6 E-4. The chip measures 4.3/spl times/4.1 mm square and is mounted on a 76-pin ceramic substrate. The structural and electrical design of the crosspoint are described and some considerations about the modeling are discussed.
Keywords
Bipolar integrated circuits; Electronic switching systems; Semiconductor switches; Telephone switching equipment; bipolar integrated circuits; electronic switching systems; semiconductor switches; telephone switching equipment; Breakdown voltage; Capacitance; Cathodes; Couplings; Dielectric losses; Dielectric substrates; Insertion loss; Semiconductor device measurement; Switches; Switching systems;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1981.1051575
Filename
1051575
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