Sequential Testing for Comparison of the Mean Time Between Failures for Two Systems

Author

Michlin, Yefim H. ; Grabarnik, Genady Ya

Author_Institution

Fac. of Ind. & Manage. Eng, Technion-Israel Inst. of Technol., Haifa

Volume

56

Issue

2

fYear

2007

fDate

6/1/2007 12:00:00 AM

Firstpage

321

Lastpage

331

Abstract

This study deals with simultaneous testing of two systems, one "basic" (subscript b), and the other "new" (n), both with an exponential distribution describing the times between failures. We test whether the mean TBF_n/MTBF_b ratio equals a given value, versus whether it is smaller than the given value. These tests yield a binomial pattern. A recursive algorithm calculates the probability of a given combination of failure numbers in the systems, permitting rapid, accurate determination of the test characteristics. The influence of truncation of Wald\´s Sequential Probability Ratio Test (SPRT) on its characteristics is analysed, and relationships are derived for calculating the coordinates of truncation apex (TA). A test planning methodology is presented for the most common cases

Keywords

binomial distribution; exponential distribution; failure analysis; planning; reliability theory; statistical testing; MTBF; SPRT; Wald´s sequential probability ratio test; binomial pattern; exponential distribution; mean time between failures; recursive algorithm; test planning methodology; truncation apex; Absorption; Councils; Engineering management; Exponential distribution; Failure analysis; Probability; Root mean square; Sequential analysis; System testing; Technology management; MTBF ratio; sequential testing; test truncation;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/TR.2007.896679

Filename

4220793