DocumentCode
895579
Title
Radiation Effects in a Virtual Phase CCD Imager
Author
McGrath, R.Daniel
Author_Institution
Interface Technology Laboratory Texas Instruments 13500 N. Central Expressway Dallas, Texas 75265
Volume
28
Issue
6
fYear
1981
Firstpage
4027
Lastpage
4032
Abstract
CCD imagers fabricated using a single gate process have been subjected to total dose ¿-ray exposures of 1 megarad. The devices are operational after the test. The effect of the radiation on the performance is discussed.
Keywords
Charge coupled devices; Clocks; Instruments; Ionizing radiation; Laboratories; Lighting; Pixel; Radiation effects; Space technology; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4335668
Filename
4335668
Link To Document