Measurement of X-Ray Induced Electron Emission

The development and use of a magnetic spectrograph for the measurement of X-ray induced electron emission is described. Results are presented for metal and dielectric targets ranging in atomic number from Z=82 to Z=6. Materials studied were lead, tantalum, copper, aluminum, magnesium, solar cell cover glass, silica cloth, thermal control paint (A surface coating with specific thermal absorption and emissivity properties), Kevlar, Mylar and conducting and non-conducting epoxy. Direct measurement was made of the quantum yield and energy distribution of electrons emitted at angles of 0°, 30°, 45° and 60° with respect to the surface normal of targets exposed to normal incidence unfiltered and filtered (0.12 cm Al) 50kV bremsstrahlung x rays. The range of electron energies analyzed was 0.1 keV to ¿ 50 keV. Experimental results are compared with previous measurements and with QUICKE 2M3 predictions where predictive capability matches the measurement range.