DocumentCode
900249
Title
A simple measurement method to determine the burst acquisition time of digital systems
Author
Hatamoto, Curtis ; Fu, Huajing ; Feher, Kamilo
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
Volume
45
Issue
3
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
764
Lastpage
766
Abstract
A cost-efficient solution for measuring fast and ultrafast synchronization-caused bit errors is disclosed. This invention enables the user to modify conventional test instruments and to eliminate the need to obtain very expensive test equipment. Our new instrumentation implementation concept comprises a gated switch added to a pseudorandom bit sequence generator and analyzer. The synchronization time of a couple of circuits is tested
Keywords
data acquisition; synchronisation; time measurement; bit errors; burst acquisition time measurement; circuits; digital systems; gated switch; pseudorandom bit sequence generator; test instrumentation; ultrafast synchronization; Circuit testing; Computer errors; Delay; Digital systems; Electrical resistance measurement; Frequency conversion; Frequency estimation; Frequency synchronization; Prototypes; Time measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.494597
Filename
494597
Link To Document