DocumentCode
902666
Title
The relation between the current constriction and the area of a transistor
Author
Kisaki, H.
Volume
57
Issue
2
fYear
1969
Firstpage
218
Lastpage
219
Abstract
The relationship between rate of current change and temperature change in the small thermally weak region of a transistor, which is caused by thermal feedback mechanism, was discussed by Scarlett and Shockley [1] and Bergmann and Gerstner [2]. This relationship is given quantitatively as a function of the total area and stabilizing resistance of a transistor.
Keywords
Circuits; Crystals; Differential equations; Doping; Feedback; Heat sinks; Power transistors; Temperature; Thermal resistance; Voltage;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1969.6923
Filename
1448853
Link To Document