• DocumentCode
    907542
  • Title

    Simulation of the Treat-Upgrade Automatic Reactor Control System

  • Author

    Lipinski, W.C. ; Kirsch, L.W. ; Valente, A.D.

  • Author_Institution
    Reactor Analysis and Safety Division Argonne National Laboratory 9700 S. Cass Avenue Argonne, Illinois 60439
  • Volume
    32
  • Issue
    1
  • fYear
    1985
  • Firstpage
    1007
  • Lastpage
    1011
  • Abstract
    This paper describes the design of the Automatic Reactor Control System (ARCS) for the Transient Reactor Test Facility (TREAT) Upgrade. A simulation was used to facilitate the ARCS design and to completely test and verify its operation before installation at the TREAT facility. The ARCS is a microprocessor network based closed loop control system that provides a position demand control signal to the transient rod hydraulic drive system. There are four identical servo-hydraulic rod drives and each operates as a position control system. The ARCS updates its position demand control signal every 1 msec and its function Is to control the transient rods so that the reactor follows a prescribed power-time profile (planned transient). The Main Control Algorithm (MCA) for the ARCS is an optimal reactivity demand algorithm. At each time step, the MCA generates a set of reference reactor functions, e.g., power, period, energy, and delayed neutron power. These functions are compared to plant measurements and estimated values at each time step and are operated on by appropriate algorithms to generate the reactivity demand function. The data necessary to calculate the reference functions is supplied from a Transient Prescription Control Data Set (TPCDS). The TPCDS specifies the planned transient as a fixed number of simply connected independent power profile segments. The developed simulation code, models the TREAT reactor kinetics, the hydraulic rod drive system, the plant measurement system, and the ARCS control processor MCA.
  • Keywords
    Automatic control; Control system synthesis; Control systems; Hydraulic drives; Inductors; Microprocessors; Optimal control; Position control; Test facilities; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1985.4336988
  • Filename
    4336988